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SCANNING ELECTRON MICROSCOPE SEM

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SCANNING ELECTRON MICROSCOPE:

Seron has been the first to introduce and launchavariety ofnew techniques,asthe namesuggests. In2005,Serondevelopedthe firstmicro e-beamjoining systeminthe world.  Followedbyintroducinganew solutionfornanomechatronics,the HybridX-rayimagingSEMby applyingelectronopticstoX-raytube.

Seronalsointroducedarangeofproducts  foradvancedresearch aswellas industrialrequirements.

SeronTechnologiesInc.'sdesktopseriesandcompactseriesare  costeffectivesolutionsfully developedbySeron'sexpertise.

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